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Physical ConstantsUnits of MeasurePhysical QuantitiesSI PrefixesRing IndexGeneral FormulaeExact FormulaeSource Documents
Version 2.3.3 - 6414 Terms
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Terms sourced from: http://iupac.org/publications/pac/51/11/2243/

"General Aspects of Trace Analytical Methods—IV. Recommendations for Nomenclature, Standard Procedures and Reporting of Experimental Data for Surface Analysis Techniques", , Pure And Applied Chemistry 1979, 51(11), 2243

Auger electron yield
chemical shiftclean surfaceconcentration in experimental surface (or surface concentration)
depth profiledepth resolutiondetection limit
escape depth (for surface analysis techniques)
ion probe microanalysis (IPMA)ion scattering spectrometry (ISS)
matrix effect
photoelectron yield
qualitative elemental specificity
relative detection limitRutherford backscattering (RBS)
sputter yieldsputteringsurfacesurface contaminationsurface coverage, θ
trace element
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