relative detection limit
(Often incorrectly referred to as @S05606@). Smallest amount of material detectable (3σ-criterion) in a matrix relative to the amount of material analysed — given in atomic, @M03980@ or @W06668@ fractions.
PAC, 1979, 51, 2243. (General Aspects of Trace Analytical Methods—IV. Recommendations for Nomenclature, Standard Procedures and Reporting of Experimental Data for Surface Analysis Techniques) on page 2247 [Terms] [Paper]