Any technique which is based on the diffraction of high energy electrons (E0 = 10 - 200 keV) in crystalline materials and evaluation of the angular distribution of the transmitted electrons. The diffraction pattern represents an image of the reciprocal lattice and therefore contains information about crystal structure. This technique is also often called selected area electron diffraction (
SAED). For consistency with other electron diffraction techniques, however, the term
THEED is recommended.
Source:
Orange Book, 2nd ed., p. 248 (https://media.iupac.org/publications/analytical_compendium/)