https://doi.org/10.1351/goldbook.08765
Measurement method of X-ray fluorescence analysis in which a collimated X-ray flux impinges on a smooth surface under a grazing angle; rendering total reflection is used to excite atoms in the top layers of the material for measurement of the amounts of elements.
Note:
The method is highly sensitive because interfering X-rays of higher energies are refracted or adsorbed. Mass fractions of
The method is highly sensitive because interfering X-rays of higher energies are refracted or adsorbed. Mass fractions of