static secondary-ion mass spectrometry

acronym: SSIMS
https://doi.org/10.1351/goldbook.09193

Method of secondary-ion mass spectrometry using low current densities for analysis of sample surface components, in contrast with dynamic secondary-ion mass spectrometry, which is used for analysis of components in the depth direction.

Notes:
  1. When the sample is an organic molecule in solid form, the term is often changed to organic SIMS or molecular SIMS.
  2. The ion areic dose during measurement is restricted to less than 1016 ions per m2 to an extent that depends on both the material of the sample and the size of the molecular fragments being analysed.
  3. Ions are usually detected by a time of flight mass spectrometer (TOF-SIMS).
Source:
PAC, 2020, 92, 1781. (Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)) on page 1789 [Terms] [Paper]
Citation: 'static secondary-ion mass spectrometry' in IUPAC Compendium of Chemical Terminology, 5th ed. International Union of Pure and Applied Chemistry; 2025. Online version 5.0.0, 2025. https://doi.org/10.1351/goldbook.09193 RIS BibTex EndNote
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