https://doi.org/10.1351/goldbook.09271
Distance from the surface at which an energetic ion or atom comes to rest in the sample, projected along the direction of the beam.
Notes:
- Used in energetic-ion analysis, Rutherford backscattering spectrometry, and secondary-ion mass spectrometry.
- Calculations usually deal with the mean or average projected range for a large number of ions or atoms of the same species and the same energy.
See also: range straggling