fast-atom bombardment secondary ion mass spectrometry

acronym: FAB-SIMS
https://doi.org/10.1351/goldbook.09400
Secondary ion mass spectrometry in which the primary-ion beam is replaced by a fast-atom beam.
Source:
PAC, 2020, 92, 1781. (Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)) on page 1839 [Terms] [Paper]
Citation: 'fast-atom bombardment secondary ion mass spectrometry' in IUPAC Compendium of Chemical Terminology, 5th ed. International Union of Pure and Applied Chemistry; 2025. Online version 5.0.0, 2025. https://doi.org/10.1351/goldbook.09400 RIS BibTex EndNote
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