static limit

in secondary-ion mass spectrometry
https://doi.org/10.1351/goldbook.09429

Ion fluence above which any significant changes in the spectrum, arising from beam damage, are observed in secondary ion mass spectrometry.

Notes:
  1. Classically, a limit of 1012 ions per cm2, or 1016 ions per m2 is taken as the limit not to be exceeded in static secondary ion mass spectrometry. This limit is based on one incident ion for each 1000 surface atoms.
  2. For imaging, the total molecular signal can be used, and here the limit can be greater and reach 100 times the limit given in Note 1.
  3. For large molecules, the damage cross section and disappearance cross section are both generally larger than for small molecules, leading to a static limit less than 1012 ions per cm2.
Source:
PAC, 2020, 92, 1781. (Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)) on page 1845 [Terms] [Paper]
Citation: 'static limit' in IUPAC Compendium of Chemical Terminology, 5th ed. International Union of Pure and Applied Chemistry; 2025. Online version 5.0.0, 2025. https://doi.org/10.1351/goldbook.09429 RIS BibTex EndNote
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