interfacial layer width, σS

in thin films
https://doi.org/10.1351/goldbook.I03086
The characteristic length defined by the variance of the Gaussian function fitted to the gradient of the electron density profile established by X-ray specular reflectivity studies of the liquid interface.
Source:
PAC, 1994, 66, 1667. (Thin films including layers: terminology in relation to their preparation and characterization (IUPAC Recommendations 1994)) on page 1674 [Terms] [Paper]
Citation: 'interfacial layer width' in IUPAC Compendium of Chemical Terminology, 5th ed. International Union of Pure and Applied Chemistry; 2025. Online version 5.0.0, 2025. https://doi.org/10.1351/goldbook.I03086 RIS BibTex EndNote
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