secondary electron yield

in in situ microanalysis
The number of @S05518@ generated per @P04829@ for a given specimen and experimental conditions. It depends on the (mean) @A00499@ of the excited area of the sample, the @A00346@ between electron beam and sample surface, the primary electron energy, thickness of the sample and sample potentials.
PAC, 1983, 55, 2023. (Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)) on page 2026 [Terms] [Paper]