Any technique in which an electron transparent sample is bombarded with an electron beam and the intensity of the transmitted electrons which is determined by @S05487@ phenomena (electron absorption phenomena) in the interior of the sample is recorded. TEM essentially provides a high resolution image of the microstructure of a thin sample. This technique is often just called @E02002@. The term @T06477@ @E02002@ is however recommended for the sake of a clear distinction from other electron microscopic techniques.
PAC, 1983, 55, 2023. (Nomenclature, symbols and units recommended for in situ microanalysis (Provisional)) on page 2024 [Terms] [Paper]