G-SIMS

https://doi.org/10.1351/goldbook.09186
Variant of static secondary-ion mass spectrometry in which the intensities for each mass in two spectra from the same area, recorded with different beam energies or different bombarding ions, are ratioed to each other and the result is used to scale one of the spectra to generate a new spectrum.
Notes:
  1. As with static SIMS, the ion areic dose during measurement is restricted to less than 1016 ions per m2 to an extent that depends on both the material of the sample and the size of the molecular fragments being analysed.
  2. The G-SIMS spectrum enables the mass of whole molecules on the surface to be determined more readily than in static SIMS.
  3. The “G” in G-SIMS originally indicated the gentleness of the process generated.
Source:
PAC, 2020, 92, 1781. (Glossary of methods and terms used in surface chemical analysis (IUPAC Recommendations 2020)) on page 1787 [Terms] [Paper]
Citation: 'G-SIMS' in IUPAC Compendium of Chemical Terminology, 5th ed. International Union of Pure and Applied Chemistry; 2025. Online version 5.0.0, 2025. https://doi.org/10.1351/goldbook.09186 RIS BibTex EndNote
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