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Physical ConstantsUnits of MeasurePhysical QuantitiesSI PrefixesRing IndexGeneral FormulaeExact FormulaeSource DocumentsTerms by IUPAC Div.
Version 3.0.1 (8049 Terms)
DOI: 10.1351/goldbook
Jan Kaiser - Content Editor
Stuart Chalk - Technical Editor
Joint Subcommittee
on the IUPAC Gold Book

Terms (21) sourced from: 10.1351/pac197951112243

"General aspects of trace analytical methods—IV. Recommendations for nomenclature, standard procedures and reporting of experimental data for surface analysis techniques", Analytical Chemistry Division, Pure and Applied Chemistry 1979, 51(11), 2243

Auger electron yield
chemical shift clean surface concentration in experimental surface (or surface concentration)
depth profile depth resolution detection limit
escape depth (for surface analysis techniques)
ion probe microanalysis ion scattering spectrometry
matrix effect
photoelectron yield
qualitative elemental specificity
Rutherford backscattering relative detection limit
sputter yield sputtering surface surface contamination surface coverage θ
trace element
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